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NEW AP INTERFACE ALLOWS MULTICHANNEL, CHIP-LEVEL ANALYSIS

Created 11 Nov 2008

Summary: APx Digital Serial I/O Option Enables Component-level Testing & Design

Electronica, Munich, November 11, 2008: Audio Precision, the recognized standard in audio test and measurement, is introducing a new digital serial I/O module for its respected range of APx audio analyzers. The multichannel APx Digital Serial I/O option allows engineers to test audio devices at the level of individual IC’s rather than being limited to evaluating only the external inputs and outputs of a device. The digital serial option will be of particular interest to HDMI chip developers. When used with AP’s existing HDMI interface option, an APx analyzer — already the only product capable measuring audio embedded in HDMI — becomes a simple but unrivalled HDMI chip debugging tool.

Aside from its applications in HDMI chip design, the Digital Serial option allows all normal audio measurements to be carried out on A/D and D/A converters, codecs, DSP’s, and sample rate converters.  There’s built-in support for the most widespread serial interface formats, including left justified, right justified, DSP and I2S, and the interface can generate and measure up to eight audio channels simultaneously using TDM or multiple data lines.  Other innovations include independent input and output clocks, dedicated, buffered oscilloscope monitors, and presets for testing popular audio devices.

“A multichannel world needs multichannel connectivity at every level,” says Tom Kite, Audio Precision’s Vice President of Engineering, “An engineer armed with an eight-channel APx585 and the Digital Serial I/O is ready for anything from the circuit board to the speaker outputs.”

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